Nanoscience Instruments (Booth 520) provides a variety of solutions to meet test and measurement requirements.
The dimensions, durability and quality of fibers can be determined using a scanning electron microscope (SEM). SEM coupled with energy-dispersive X-ray spectroscopy (EDS) can be used to identify contamination or particulates caught in a filter.
With the introduction of nanofibers, fibers having diameters smaller than a micron, greater resolution is often required. In less than a minute from load to image, the Phenom desktop SEM is the fastest and easiest way to get data and keep a company’s research or product development work moving forward.
Coupled with the Phenom SEM’s FiberMetric automated analysis software, users can quickly acquire quantitative information about fiber parameters. Fiber diameter and size distribution are key to product performance. Filters require a target range of diameters for filtration efficiency. To obtain a quantitative distribution of diameters, many measurements have to be acquired. The high depth of field of the SEM allows for many fibers to be counted in a single image.
FILTRATION
Nanoscience Instruments to Show Phenom SEM
Scanning electron microscope evaluates filters.
